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X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices. [electronic resource] by
- Carta, D
- Guttmann, P
- Regoutz, A
- Khiat, A
- Serb, A
- Gupta, I
- Mehonic, A
- Buckwell, M
- Hudziak, S
- Kenyon, A J
- Prodromakis, T
Producer: 20180718
In:
Nanotechnology vol. 27
Availability: No items available.
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Understanding the electronic structure of IrO2 using hard-X-ray photoelectron spectroscopy and density-functional theory. [electronic resource] by
- Kahk, J M
- Poll, C G
- Oropeza, F E
- Ablett, J M
- Céolin, D
- Rueff, J-P
- Agrestini, S
- Utsumi, Y
- Tsuei, K D
- Liao, Y F
- Borgatti, F
- Panaccione, G
- Regoutz, A
- Egdell, R G
- Morgan, B J
- Scanlon, D O
- Payne, D J
Producer: 20140618
In:
Physical review letters vol. 112
Availability: No items available.
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Quantifying the critical thickness of electron hybridization in spintronics materials. [electronic resource] by
- Pincelli, T
- Lollobrigida, V
- Borgatti, F
- Regoutz, A
- Gobaut, B
- Schlueter, C
- Lee, T-L
- Payne, D J
- Oura, M
- Tamasaku, K
- Petrov, A Y
- Graziosi, P
- Granozio, F Miletto
- Cavallini, M
- Vinai, G
- Ciprian, R
- Back, C H
- Rossi, G
- Taguchi, M
- Daimon, H
- van der Laan, G
- Panaccione, G
Producer: 20181113
In:
Nature communications vol. 8
Availability: No items available.
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