Tetracene film morphology: comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations. [electronic resource]

By: Contributor(s): Producer: 20121220Description: 421-4 p. digitalISSN:
  • 1292-895X
Online resources: In: The European physical journal. E, Soft matter vol. 27
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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