APA
Silva A. d. M., Figueiredo V. M. G. d., Massi M., Prado R. F. d., Silva Sobrinho A. S. d., Queiroz J. R. C. d. & Nogueira Junior L. (20191126). Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis. : Journal of investigative and clinical dentistry.
Chicago
Silva Alecsandro de Moura, Figueiredo Viviane Maria Gonçalves de, Massi Marcos, Prado Renata Falchete do, Silva Sobrinho Argemiro Soares da, Queiroz José Reinaldo Cavalcanti de and Nogueira Junior Lafayette. 20191126. Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis. : Journal of investigative and clinical dentistry.
Harvard
Silva A. d. M., Figueiredo V. M. G. d., Massi M., Prado R. F. d., Silva Sobrinho A. S. d., Queiroz J. R. C. d. and Nogueira Junior L. (20191126). Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis. : Journal of investigative and clinical dentistry.
MLA
Silva Alecsandro de Moura, Figueiredo Viviane Maria Gonçalves de, Massi Marcos, Prado Renata Falchete do, Silva Sobrinho Argemiro Soares da, Queiroz José Reinaldo Cavalcanti de and Nogueira Junior Lafayette. Silicon-based film on the yttria-stabilized tetragonal zirconia polycrystal: Surface and shear bond strength analysis. : Journal of investigative and clinical dentistry. 20191126.