Effects of Si-rich oxide layer stoichiometry on the structural and optical properties of Si QD/SiO2 multilayer films. [electronic resource]

By: Contributor(s): Producer: 20100311Description: 485703 p. digitalISSN:
  • 1361-6528
Online resources: In: Nanotechnology vol. 20
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Publication Type: Journal Article; Research Support, Non-U.S. Gov't

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