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	1.	In situ electron beam induced current measurements of the local thickness in semiconductor devices. [electronic resource] by Czerwinski, A Płuska, M Ratajczak, J Katcki, J Producer: 20070117 In: Journal of microscopy vol. 224 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Elimination of scanning electron microscopy image periodic distortions with digital signal-processing methods. [electronic resource] by Płuska, M Czerwinski, A Ratajczak, J Katcki, J Rak, R Producer: 20070117 In: Journal of microscopy vol. 224 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance. [electronic resource] by Czerwinski, A Pluska, M Ratajczak, J Szerling, A Katcki, J Producer: 20100830 In: Journal of microscopy vol. 237 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Identification of electron beam vibration sources by separation of magnetic distortion from electric distortion on scanning electron microscope imaging. [electronic resource] by Pluska, M Czerwinski, A Ratajczak, J Katcki, J Oskwarek, Ł Rak, R Producer: 20100830 In: Journal of microscopy vol. 237 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Buried amorphous-layer impact on dislocation densities in silicon. [electronic resource] by Wzorek, M Katcki, J Płuska, M Ratajczak, J Jaroszewicz, B Domański, K Grabiec, P Producer: 20070117 In: Journal of microscopy vol. 224 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation. [electronic resource] by Płuska, M Czerwinski, A Ratajczak, J Katcki, J Marona, L Czernecki, R Leszczyński, M Perlin, P Producer: 20100129 In: Journal of microscopy vol. 236 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)