APA

Knotek P., Plecháček T., Smolík J., Kutálek P., Dvořák F., Vlček M., Navrátil J. & Drašar Č. (2019). Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere. : Beilstein journal of nanotechnology.

Chicago

Knotek Petr, Plecháček Tomáš, Smolík Jan, Kutálek Petr, Dvořák Filip, Vlček Milan, Navrátil Jiří and Drašar Čestmír. 2019. Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere. : Beilstein journal of nanotechnology.

Harvard

Knotek P., Plecháček T., Smolík J., Kutálek P., Dvořák F., Vlček M., Navrátil J. and Drašar Č. (2019). Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere. : Beilstein journal of nanotechnology.

MLA

Knotek Petr, Plecháček Tomáš, Smolík Jan, Kutálek Petr, Dvořák Filip, Vlček Milan, Navrátil Jiří and Drašar Čestmír. Kelvin probe force microscopy of the nanoscale electrical surface potential barrier of metal/semiconductor interfaces in ambient atmosphere. : Beilstein journal of nanotechnology. 2019.