APA
Ping Wang Y., Letoublon A., Nguyen Thanh T., Bahri M., Largeau L., Patriarche G., Cornet C., Bertru N., Le Corre A. & Durand O. (2015). Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup. : Journal of applied crystallography.
Chicago
Ping Wang Yan, Letoublon Antoine, Nguyen Thanh Tra, Bahri Mounib, Largeau Ludovic, Patriarche Gilles, Cornet Charles, Bertru Nicolas, Le Corre Alain and Durand Olivier. 2015. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup. : Journal of applied crystallography.
Harvard
Ping Wang Y., Letoublon A., Nguyen Thanh T., Bahri M., Largeau L., Patriarche G., Cornet C., Bertru N., Le Corre A. and Durand O. (2015). Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup. : Journal of applied crystallography.
MLA
Ping Wang Yan, Letoublon Antoine, Nguyen Thanh Tra, Bahri Mounib, Largeau Ludovic, Patriarche Gilles, Cornet Charles, Bertru Nicolas, Le Corre Alain and Durand Olivier. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup. : Journal of applied crystallography. 2015.