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	1.	Mitigating Curtaining Artifacts During Ga FIB TEM Lamella Preparation of a 14 nm FinFET Device. [electronic resource] by Denisyuk, Andrey Hrnčíř, Tomáš Vincenc Oboňa, Jozef Petrenec, Martin Michalička, Jan Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Fatigue Life of 7475-T7351 Aluminum After Local Severe Plastic Deformation Caused by Machining. [electronic resource] by Ohnistova, Petra Piska, Miroslav Petrenec, Martin Dluhos, Jiri Hornikova, Jana Sandera, Pavel Publication details: Materials (Basel, Switzerland) Nov 2019 In: Materials (Basel, Switzerland) vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Assessment of Retained Austenite in Fine Grained Inductive Heat Treated Spring Steel. [electronic resource] by Olina, Anna Píška, Miroslav Petrenec, Martin Hervoches, Charles Beran, Přemysl Pechoušek, Jiří Král, Petr Publication details: Materials (Basel, Switzerland) Dec 2019 In: Materials (Basel, Switzerland) vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Ultrasmooth metallic foils for growth of high quality graphene by chemical vapor deposition. [electronic resource] by Procházka, Pavel Mach, Jindřich Bischoff, Dominik Lišková, Zuzana Dvořák, Petr Vaňatka, Marek Simonet, Pauline Varlet, Anastasia Hemzal, Dušan Petrenec, Martin Kalina, Lukáš Bartošík, Miroslav Ensslin, Klaus Varga, Peter Čechal, Jan Šikola, Tomáš Producer: 20150330 In: Nanotechnology vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)