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	1.	Probe--sample coupling in the magnetic resonance force microscope. [electronic resource] by Suter, A Pelekhov, D V Roukes, M L Hammel, P C Producer: 20020911 In: Journal of magnetic resonance (San Diego, Calif. : 1997) vol. 154 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Design of a variable temperature scanning force microscope. [electronic resource] by Nazaretski, E Graham, K S Thompson, J D Wright, J A Pelekhov, D V Hammel, P C Movshovich, R Producer: 20091104 In: The Review of scientific instruments vol. 80 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Magnetic resonance force detection using a membrane resonator. [electronic resource] by Scozzaro, N Ruchotzke, W Belding, A Cardellino, J Blomberg, E C McCullian, B A Bhallamudi, V P Pelekhov, D V Hammel, P C Producer: 20180719 In: Journal of magnetic resonance (San Diego, Calif. : 1997) vol. 271 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Local ferromagnetic resonance imaging with magnetic resonance force microscopy. [electronic resource] by Obukhov, Yu Pelekhov, D V Kim, J Banerjee, P Martin, I Nazaretski, E Movshovich, R An, S Gramila, T J Batra, S Hammel, P C Producer: 20080717 In: Physical review letters vol. 100 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Ferromagnetic Resonance Spin Pumping and Electrical Spin Injection in Silicon-Based Metal-Oxide-Semiconductor Heterostructures. [electronic resource] by Pu, Y Odenthal, P M Adur, R Beardsley, J Swartz, A G Pelekhov, D V Flatté, M E Kawakami, R K Pelz, J Hammel, P C Johnston-Halperin, E Producer: 20160420 In: Physical review letters vol. 115 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Quantitative magnetic force microscopy on permalloy dots using an iron filled carbon nanotube probe. [electronic resource] by Wolny, F Obukhov, Y Mühl, T Weissker, U Philippi, S Leonhardt, A Banerjee, P Reed, A Xiang, G Adur, R Lee, I Hauser, A J Yang, F Y Pelekhov, D V Büchner, B Hammel, P C Producer: 20120105 In: Ultramicroscopy vol. 111 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)