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	1.	Multiple angle ellipsometric analysis of surface layers and surface layer contaminants. [electronic resource] by Pedinoff, M E Stafsudd, O M Producer: 20121002 In: Applied optics vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Strain induced anisotropy in As(2)S(3), As(2)Se(3), and ZnSe films on KCI substrates via 10.6-microm and 0.6328-microm ellipsometer measurements and 0.6328-microm reflector measurements. [electronic resource] by Pedinoff, M E Stafsudd, O M Producer: 20121002 In: Applied optics vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Refractive indices of ir materials: 10.6-microm ellipsometer measurements. [electronic resource] by Pedinoff, M E Braunstein, M Stafsudd, O M Producer: 20121002 In: Applied optics vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Strain-induced anisotropy measurement in oxide films grown on silicon. [electronic resource] by Pedinoff, M E Mayer, D C Stafsudd, O M Dunn, G L Producer: 20100610 In: Applied optics vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Coherent optical adaptive techniques: design and performance of an 18-element visible multidither COAT system. [electronic resource] by Pearson, J E Bridges, W B Hansen, S Nussmeier, T A Pedinoff, M E Producer: 20121002 In: Applied optics vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)