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	1.	[Not Available]. [electronic resource] by Paton, B E Producer: 19850814 In: Voprosy istorii estestvoznaniia i tekhniki (Institut istorii estestvoznaniia i tekhniki (Akademiia nauk SSSR)) no. 4 Availability: No items available. Save to lists Add to cart (remove)
	2.	Detection of defects in multiple-layer structures by using surface plasmon resonance. [electronic resource] by Lévesque, L Paton, B E Producer: 20121002 In: Applied optics vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Precise thickness and refractive index determination of polyimide films using attenuated total reflection. [electronic resource] by Lévesque, L Paton, B E Payne, S H Producer: 20121002 In: Applied optics vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Fiber optic displacement sensor with subangstrom resolution. [electronic resource] by Breen, S Paton, B E Blackford, B L Jericho, M H Producer: 20121002 In: Applied optics vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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