APA

Sowade E., Ramon E., Mitra K. Y., Martínez-Domingo C., Pedró M., Pallarès J., Loffredo F., Villani F., Gomes H. L., Terés L. & Baumann R. R. (20180521). All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis. : Scientific reports.

Chicago

Sowade Enrico, Ramon Eloi, Mitra Kalyan Yoti, Martínez-Domingo Carme, Pedró Marta, Pallarès Jofre, Loffredo Fausta, Villani Fulvia, Gomes Henrique L, Terés Lluís and Baumann Reinhard R. 20180521. All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis. : Scientific reports.

Harvard

Sowade E., Ramon E., Mitra K. Y., Martínez-Domingo C., Pedró M., Pallarès J., Loffredo F., Villani F., Gomes H. L., Terés L. and Baumann R. R. (20180521). All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis. : Scientific reports.

MLA

Sowade Enrico, Ramon Eloi, Mitra Kalyan Yoti, Martínez-Domingo Carme, Pedró Marta, Pallarès Jofre, Loffredo Fausta, Villani Fulvia, Gomes Henrique L, Terés Lluís and Baumann Reinhard R. All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis. : Scientific reports. 20180521.