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Results of search for 'au:"Opalevs, Dmitrijs"'
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Authors
Chen, Chuangtian
Gilfert, Christian
Kaenders, Wilhelm
Kirner, Raoul
Leisching, Patrick
Li, Rukang
Noell, Wilfried
Opalevs, Dmitrijs
Rockstuhl, Carsten
Scharf, Toralf
Scholz, Matthias
Vetter, Andreas
Voelkel, Reinhard
Wang, Guiling
Wang, Xiaoyang
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Topics
Equipment Design
Equipment Failure Analysis
Lasers, Solid-State
Lighting
instrumentation
Languages
English
Your search returned 3 results.
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1.
1.3-mW tunable and narrow-band continuous-wave light source at 191 nm.
[electronic resource]
by
Scholz, Matthias
Opalevs, Dmitrijs
Leisching, Patrick
Kaenders, Wilhelm
Wang, Guiling
Wang, Xiaoyang
Li, Rukang
Chen, Chuangtian
Producer:
20130328
In:
Optics express
vol. 20
Online resources:
Available from publisher's website
Availability:
No items available.
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2.
Printing sub-micron structures using Talbot mask-aligner lithography with a 193 nm CW laser light source.
[electronic resource]
by
Vetter, Andreas
Kirner, Raoul
Opalevs, Dmitrijs
Scholz, Matthias
Leisching, Patrick
Scharf, Toralf
Noell, Wilfried
Rockstuhl, Carsten
Voelkel, Reinhard
Producer:
20180823
In:
Optics express
vol. 26
Online resources:
Available from publisher's website
Availability:
No items available.
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3.
Mask-aligner lithography using a continuous-wave diode laser frequency-quadrupled to 193 nm.
[electronic resource]
by
Kirner, Raoul
Vetter, Andreas
Opalevs, Dmitrijs
Gilfert, Christian
Scholz, Matthias
Leisching, Patrick
Scharf, Toralf
Noell, Wilfried
Rockstuhl, Carsten
Voelkel, Reinhard
Producer:
20180207
In:
Optics express
vol. 26
Online resources:
Available from publisher's website
Availability:
No items available.
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(remove)