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	1.	Mechanical and Electrical Reliability Analysis of Flexible Si Complementary Metal-Oxide-Semiconductor Integrated Circuit. [electronic resource] by Kim, Seungyoon Kim, Cheolgyu Bong, Jae Hoon Hwang, Wan Sik Kim, Taek-Soo Oh, Jae Sub Cho, Byung Jin Publication details: Journal of nanoscience and nanotechnology Oct 2019 In: Journal of nanoscience and nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	A sub-1-volt nanoelectromechanical switching device. [electronic resource] by Lee, Jeong Oen Song, Yong-Ha Kim, Min-Wu Kang, Min-Ho Oh, Jae-Sub Yang, Hyun-Ho Yoon, Jun-Bo Producer: 20130528 In: Nature nanotechnology vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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