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	1.	Complex Internal Bias Fields in Ferroelectric Hafnium Oxide. [electronic resource] by Schenk, Tony Hoffmann, Michael Ocker, Johannes Pešić, Milan Mikolajick, Thomas Schroeder, Uwe Producer: 20160107 In: ACS applied materials & interfaces vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors. [electronic resource] by Mulaosmanovic, Halid Ocker, Johannes Müller, Stefan Schroeder, Uwe Müller, Johannes Polakowski, Patrick Flachowsky, Stefan van Bentum, Ralf Mikolajick, Thomas Slesazeck, Stefan Producer: 20180727 In: ACS applied materials & interfaces vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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