Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors. [electronic resource]

By: Contributor(s): Producer: 20050502Description: 67-81 p. digitalISSN:
  • 0304-3991
Online resources: In: Ultramicroscopy vol. 103
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Publication Type: Journal Article

There are no comments on this title.

to post a comment.