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	1.	Castaing's Electron Microprobe and Its Impact on Materials Science. [electronic resource] by Newbury, Dale E Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Mar 2001 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Mistakes encountered during automatic peak identification of minor and trace constituents in electron-excited energy dispersive X-ray microanalysis. [electronic resource] by Newbury, Dale E Producer: 20090826 In: Scanning vol. 31 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	X-ray spectrometry and spectrum image mapping at output count rates above 100 kHz with a silicon drift detector on a scanning electron microscope. [electronic resource] by Newbury, Dale E Producer: 20051209 In: Scanning vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Quantitative electron probe microanalysis of rough targets: testing the peak-to-local background method. [electronic resource] by Newbury, Dale E Producer: 20040817 In: Scanning vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy. [electronic resource] by Newbury, Dale E Producer: 20160722 In: Journal of research of the National Institute of Standards and Technology vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Misidentification of major constituents by automatic qualitative energy dispersive X-ray microanalysis: a problem that threatens the credibility of the analytical community. [electronic resource] by Newbury, Dale E Producer: 20070719 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 11 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Mistakes encountered during automatic peak identification in low beam energy X-ray microanalysis. [electronic resource] by Newbury, Dale E Producer: 20070913 In: Scanning vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope. [electronic resource] by Newbury, Dale E Producer: 20160722 In: Journal of research of the National Institute of Standards and Technology vol. 107 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	The new X-ray mapping: X-ray spectrum imaging above 100 kHz output count rate with the silicon drift detector. [electronic resource] by Newbury, Dale E Producer: 20070719 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Electron-excited energy dispersive X-ray spectrometry at high speed and at high resolution: silicon drift detectors and microcalorimeters. [electronic resource] by Newbury, Dale E Producer: 20091201 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Assessing charging effects on spectral quality for X-ray microanalysis in low voltage and variable pressure/environmental scanning electron microscopy. [electronic resource] by Newbury, Dale E Producer: 20091202 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Introduction: 40 Years of EDS. [electronic resource] by Newbury, Dale E Gauvin, Raynald Producer: 20100129 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	"Derived spectra" software tools for detecting spatial and spectral features in spectrum images. [electronic resource] by Newbury, Dale E Bright, David S Producer: 20050315 In: Scanning vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Uncertainty estimates for electron probe X-ray microanalysis measurements. [electronic resource] by Ritchie, Nicholas W M Newbury, Dale E Producer: 20131114 In: Analytical chemistry vol. 84 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure! [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20180712 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 10 2019 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope? [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20111107 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20151224 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative? [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20131205 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20180627 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 28 results.