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	1.	Computer-aided manufacturing and focused ion beam technology enable machining of complex micro- and nano-structures. [electronic resource] by Niessen, Frank Nancarrow, Mitchell J B Publication details: Nanotechnology Oct 2019 In: Nanotechnology vol. 30 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Probe current determination in analytical TEM/STEM and its application to the characterization of large area EDS detectors. [electronic resource] by Mitchell, David R G Nancarrow, Mitchell J B Producer: 20160108 In: Microscopy research and technique vol. 78 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Thermoelectric performance of n-type Mg [electronic resource] by Santos, Rafael Nancarrow, Mitchell Dou, Shi Xue Aminorroaya Yamini, Sima Producer: 20181217 In: Scientific reports vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Transmission Kikuchi diffraction versus electron back-scattering diffraction: A case study on an electron transparent cross-section of TWIP steel. [electronic resource] by Gazder, Azdiar A Elkhodary, Khalil I Nancarrow, Mitchell J B Saleh, Ahmed A Producer: 20180124 In: Micron (Oxford, England : 1993) vol. 103 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	A Liquid-Metal-Based Magnetoactive Slurry for Stimuli-Responsive Mechanically Adaptive Electrodes. [electronic resource] by Ren, Long Sun, Shuaishuai Casillas-Garcia, Gilberto Nancarrow, Mitchell Peleckis, Germanas Turdy, Mirzat Du, Kunrong Xu, Xun Li, Weihua Jiang, Lei Dou, Shi Xue Du, Yi Producer: 20190226 In: Advanced materials (Deerfield Beach, Fla.) vol. 30 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)