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	1.	Are freon propellants inert? [electronic resource] by Nicholas, W M Producer: 19741219 In: New York state journal of medicine vol. 74 Availability: No items available. Save to lists Add to cart (remove)
	2.	Diluvian Clustering: A Fast, Effective Algorithm for Clustering Compositional and Other Data. [electronic resource] by Ritchie, Nicholas W M Producer: 20151224 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Efficient Simulation of Secondary Fluorescence Via NIST DTSA-II Monte Carlo. [electronic resource] by Ritchie, Nicholas W M Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Spectrum simulation in DTSA-II. [electronic resource] by Ritchie, Nicholas W M Producer: 20091106 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Using DTSA-II to simulate and interpret energy dispersive spectra from particles. [electronic resource] by Ritchie, Nicholas W M Producer: 20100809 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS). [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Publication details: Journal of materials science In: Journal of materials science vol. 50 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Can X-ray spectrum imaging replace backscattered electrons for compositional contrast in the scanning electron microscope? [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20111107 In: Scanning vol. 33 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Quantitative Electron-Excited X-Ray Microanalysis of Borides, Carbides, Nitrides, Oxides, and Fluorides with Scanning Electron Microscopy/Silicon Drift Detector Energy-Dispersive Spectrometry (SEM/SDD-EDS) and NIST DTSA-II. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20151224 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Uncertainty estimates for electron probe X-ray microanalysis measurements. [electronic resource] by Ritchie, Nicholas W M Newbury, Dale E Producer: 20131114 In: Analytical chemistry vol. 84 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure! [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20180712 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Electron-Excited X-ray Microanalysis by Energy Dispersive Spectrometry at 50: Analytical Accuracy, Precision, Trace Sensitivity, and Quantitative Compositional Mapping. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 10 2019 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative? [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20131205 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Measurement of Trace Constituents by Electron-Excited X-Ray Microanalysis with Energy-Dispersive Spectrometry. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20180627 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	An Iterative Qualitative-Quantitative Sequential Analysis Strategy for Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry: Finding the Unexpected Needles in the Peak Overlap Haystack. [electronic resource] by Newbury, Dale E Ritchie, Nicholas W M Producer: 20181108 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Use of force-sensing array films to improve surface wipe sampling. [electronic resource] by Verkouteren, Jennifer R Ritchie, Nicholas W M Gillen, Greg Producer: 20150223 In: Environmental science. Processes & impacts vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector. [electronic resource] by Ritchie, Nicholas W M Newbury, Dale E Lindstrom, Abigail P Producer: 20120315 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	EDS measurements of X-ray intensity at WDS precision and accuracy using a silicon drift detector. [electronic resource] by Ritchie, Nicholas W M Newbury, Dale E Davis, Jeffrey M Producer: 20130131 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	DABO Boronate Promoted Conjugate Allylation of α,β-Unsaturated Aldehydes Using Copper(II) Catalysis. [electronic resource] by Roest, Pjotr C Michel, Nicholas W M Batey, Robert A Producer: 20180511 In: The Journal of organic chemistry vol. 81 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Nickel-Catalyzed Cyanation of Benzylic and Allylic Pivalate Esters. [electronic resource] by Michel, Nicholas W M Jeanneret, Alexandria D M Kim, Hyehwang Rousseaux, Sophie A L Publication details: The Journal of organic chemistry 10 2018 In: The Journal of organic chemistry vol. 83 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Bridging the micro-to-macro gap: a new application for micro X-ray fluorescence. [electronic resource] by Davis, Jeffrey M Newbury, Dale E Fahey, Albert Ritchie, Nicholas W M Vicenzi, Edward Bentz, Dale Producer: 20110909 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 24 results.