APA
Ruiz C., Parikh A., José J., Buchmann L., Caggiano J. A., Chen A. A., Clark J. A., Crawford H., Davids B., D'Auria J. M., Davis C., Deibel C., Erikson L., Fogarty L., Frekers D., Greife U., Hussein A., Hutcheon D. A., Huyse M., Jewett C., Laird A. M., Lewis R., Mumby-Croft P., Olin A., Ottewell D. F., Ouellet C. V., Parker P., Pearson J., Ruprecht G., Trinczek M., Vockenhuber C. & Wrede C. (20061003). Measurement of the Ec.m. = 184 keV resonance strength in the 26gAl (p, gamma)27 Si reaction. : Physical review letters.
Chicago
Ruiz C, Parikh A, José J, Buchmann L, Caggiano J A, Chen A A, Clark J A, Crawford H, Davids B, D'Auria J M, Davis C, Deibel C, Erikson L, Fogarty L, Frekers D, Greife U, Hussein A, Hutcheon D A, Huyse M, Jewett C, Laird A M, Lewis R, Mumby-Croft P, Olin A, Ottewell D F, Ouellet C V, Parker P, Pearson J, Ruprecht G, Trinczek M, Vockenhuber C and Wrede C. 20061003. Measurement of the Ec.m. = 184 keV resonance strength in the 26gAl (p, gamma)27 Si reaction. : Physical review letters.
Harvard
Ruiz C., Parikh A., José J., Buchmann L., Caggiano J. A., Chen A. A., Clark J. A., Crawford H., Davids B., D'Auria J. M., Davis C., Deibel C., Erikson L., Fogarty L., Frekers D., Greife U., Hussein A., Hutcheon D. A., Huyse M., Jewett C., Laird A. M., Lewis R., Mumby-Croft P., Olin A., Ottewell D. F., Ouellet C. V., Parker P., Pearson J., Ruprecht G., Trinczek M., Vockenhuber C. and Wrede C. (20061003). Measurement of the Ec.m. = 184 keV resonance strength in the 26gAl (p, gamma)27 Si reaction. : Physical review letters.
MLA
Ruiz C, Parikh A, José J, Buchmann L, Caggiano J A, Chen A A, Clark J A, Crawford H, Davids B, D'Auria J M, Davis C, Deibel C, Erikson L, Fogarty L, Frekers D, Greife U, Hussein A, Hutcheon D A, Huyse M, Jewett C, Laird A M, Lewis R, Mumby-Croft P, Olin A, Ottewell D F, Ouellet C V, Parker P, Pearson J, Ruprecht G, Trinczek M, Vockenhuber C and Wrede C. Measurement of the Ec.m. = 184 keV resonance strength in the 26gAl (p, gamma)27 Si reaction. : Physical review letters. 20061003.