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	1.	Structure and bonding at the atomic scale by scanning transmission electron microscopy. [electronic resource] by Muller, David A Producer: 20090403 In: Nature materials vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	A sound barrier for silicon? [electronic resource] by Muller, David A Producer: 20051011 In: Nature materials vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Superconductors: catching dopants in action. [electronic resource] by Mannhart, Jochen Muller, David A Producer: 20050705 In: Nature materials vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope. [electronic resource] by Hovden, Robert Muller, David A Producer: 20130529 In: Ultramicroscopy vol. 123 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Three-dimensional imaging in aberration-corrected electron microscopes. [electronic resource] by Xin, Huolin L Muller, David A Producer: 20101014 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 16 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Electron microscopy: a new spin on electron beams. [electronic resource] by Xin, Huolin L Muller, David A Producer: 20110222 In: Nature nanotechnology vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Absolute and approximate calculations of electron-energy-loss spectroscopy edge thresholds. [electronic resource] by Hamann, D R Muller, David A Producer: 20021025 In: Physical review letters vol. 89 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	The flavivirus NS1 protein: molecular and structural biology, immunology, role in pathogenesis and application as a diagnostic biomarker. [electronic resource] by Muller, David A Young, Paul R Producer: 20131029 In: Antiviral research vol. 98 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM. [electronic resource] by Xin, Huolin L Muller, David A Producer: 20090720 In: Journal of electron microscopy vol. 58 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Formation of guided Cherenkov radiation in silicon-based nanocomposites. [electronic resource] by Yurtsever, Aycan Couillard, Martin Muller, David A Producer: 20080717 In: Physical review letters vol. 100 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Beam spreading and spatial resolution in thick organic specimens. [electronic resource] by Hyun, Jerome K Ercius, Peter Muller, David A Producer: 20090210 In: Ultramicroscopy vol. 109 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Extended depth of field for high-resolution scanning transmission electron microscopy. [electronic resource] by Hovden, Robert Xin, Huolin L Muller, David A Producer: 20110524 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Is there a Stobbs factor in atomic-resolution STEM-EELS mapping? [electronic resource] by Xin, Huolin L Dwyer, Christian Muller, David A Producer: 20141106 In: Ultramicroscopy vol. 139 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Analytic derivation of optimal imaging conditions for incoherent imaging in aberration-corrected electron microscopes. [electronic resource] by Intaraprasonk, Varat Xin, Huolin L Muller, David A Producer: 20081204 In: Ultramicroscopy vol. 108 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an aberration-corrected STEM. [electronic resource] by Xin, Huolin L Zhu, Ye Muller, David A Producer: 20130131 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Dopant mapping for the nanotechnology age. [electronic resource] by Castell, Martin R Muller, David A Voyles, Paul M Producer: 20030409 In: Nature materials vol. 2 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Sampling limits for electron tomography with sparsity-exploiting reconstructions. [electronic resource] by Jiang, Yi Padgett, Elliot Hovden, Robert Muller, David A Producer: 20180807 In: Ultramicroscopy vol. 186 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Thickness measurements using photonic modes in monochromated electron energy-loss spectroscopy. [electronic resource] by Yurtsever, Aycan Couillard, Martin Hyun, Jerome K Muller, David A Producer: 20150415 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Clinical and Laboratory Diagnosis of Dengue Virus Infection. [electronic resource] by Muller, David A Depelsenaire, Alexandra C I Young, Paul R Producer: 20170420 In: The Journal of infectious diseases vol. 215 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Three-dimensional measurement of line edge roughness in copper wires using electron tomography. [electronic resource] by Ercius, Peter Gignac, Lynne M Hu, C-K Muller, David A Producer: 20090701 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 144 results.