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	1.	Fringe formation in multiaperture speckle shear interferometry. [electronic resource] by Mohan, N K Sirohi, R S Producer: 20121002 In: Applied optics vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	In-plane displacement measurement configuration with twofold sensitivity. [electronic resource] by Sirohi, R S Mohan, N K Producer: 20121002 In: Applied optics vol. 32 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Optical configuration for measurement in speckle interferometry. [electronic resource] by Sirohi, R S Mohan, N K Santhanakrishnan, T Producer: 20121002 In: Optics letters vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope. [electronic resource] by Mohan, N K Saldner, H Molin, N E Producer: 20121002 In: Optics letters vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Optical configuration for TV holography measurement of in-plane and out-of-plane deformations. [electronic resource] by Mohan, N K Andersson, A Sjödahl, M Molin, N E Producer: 20100628 In: Applied optics vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS). [electronic resource] by Bhaduri, Basanta Mohan, N K Kothiyal, M P Sirohi, R S Producer: 20121002 In: Optics express vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)