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	1.	Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy. [electronic resource] by Moertelmaier, M Huber, H P Rankl, C Kienberger, F Producer: 20140815 In: Ultramicroscopy vol. 136 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Calibrated nanoscale capacitance measurements using a scanning microwave microscope. [electronic resource] by Huber, H P Moertelmaier, M Wallis, T M Chiang, C J Hochleitner, M Imtiaz, A Oh, Y J Schilcher, K Dieudonne, M Smoliner, J Hinterdorfer, P Rosner, S J Tanbakuchi, H Kabos, P Kienberger, F Producer: 20110415 In: The Review of scientific instruments vol. 81 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Improved localization of cellular membrane receptors using combined fluorescence microscopy and simultaneous topography and recognition imaging. [electronic resource] by Duman, M Pfleger, M Zhu, R Rankl, C Chtcheglova, L A Neundlinger, I Bozna, B L Mayer, B Salio, M Shepherd, D Polzella, P Moertelmaier, M Kada, G Ebner, A Dieudonne, M Schütz, G J Cerundolo, V Kienberger, F Hinterdorfer, P Producer: 20100514 In: Nanotechnology vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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