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	1.	Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel. [electronic resource] by Mitchell, D R G Producer: 20070206 In: Journal of microscopy vol. 224 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Circular Hough transform diffraction analysis: a software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph. [electronic resource] by Mitchell, D R G Producer: 20080417 In: Ultramicroscopy vol. 108 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Contamination mitigation strategies for scanning transmission electron microscopy. [electronic resource] by Mitchell, D R G Producer: 20150626 In: Micron (Oxford, England : 1993) vol. 73 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	DiffTools: electron diffraction software tools for DigitalMicrograph. [electronic resource] by Mitchell, D R G Producer: 20080930 In: Microscopy research and technique vol. 71 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Scripting-customized microscopy tools for Digital Micrograph. [electronic resource] by Mitchell, D R G Schaffer, B Producer: 20050728 In: Ultramicroscopy vol. 103 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Dispersion of Ni [electronic resource] by Minakshi Sundaram, M Mitchell, D R G Producer: 20180220 In: Dalton transactions (Cambridge, England : 2003) vol. 46 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	RDFTools: a software tool for quantifying short-range ordering in amorphous materials. [electronic resource] by Mitchell, D R G Petersen, T C Producer: 20120504 In: Microscopy research and technique vol. 75 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Plasmon imaging: an efficient TEM-based method for locating noble metal particles dispersed on oxide catalysts at very low densities. [electronic resource] by Mitchell, D R G Wang, Xingdong Caruso, Rachel A Producer: 20080605 In: Micron (Oxford, England : 1993) vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	In situ characterisation of nanostructured multiphase thermoelectric materials at elevated temperatures. [electronic resource] by Aminorroaya Yamini, S Mitchell, D R G Avdeev, M Producer: 20180130 In: Physical chemistry chemical physics : PCCP vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Development of an ellipse fitting method with which to analyse selected area electron diffraction patterns. [electronic resource] by Mitchell, D R G Van den Berg, J A Producer: 20160415 In: Ultramicroscopy vol. 160 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Nanocolumnar Preferentially Oriented PSZT Thin Films Deposited on Thermally Grown Silicon Dioxide. [electronic resource] by Sriram, S Bhaskaran, M Mitchell, A Mitchell, D R G Kostovski, G Publication details: Nanoscale research letters Jan 2009 In: Nanoscale research letters vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Fabrication of surface magnetic nanoclusters using low energy ion implantation and electron beam annealing. [electronic resource] by Kennedy, J Leveneur, J Williams, G V M Mitchell, D R G Markwitz, A Producer: 20110518 In: Nanotechnology vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Microstructural investigation of nickel silicide thin films and the silicide-silicon interface using transmission electron microscopy. [electronic resource] by Bhaskaran, M Sriram, S Mitchell, D R G Short, K T Holland, A S Mitchell, A Producer: 20090312 In: Micron (Oxford, England : 1993) vol. 40 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates. [electronic resource] by Sriram, S Bhaskaran, M Mitchell, D R G Short, K T Holland, A S Mitchell, A Producer: 20090406 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	Iron-monosulfide oxidation in natural sediments: resolving microbially mediated S transformations using XANES, electron microscopy, and selective extractions. [electronic resource] by Burton, E D Bush, R T Sullivan, L A Hocking, R K Mitchell, D R G Johnston, S G Fitzpatrick, R W Raven, M McClure, S Jang, L Y Producer: 20090707 In: Environmental science & technology vol. 43 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)