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	1.	A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. [electronic resource] by Allard, Lawrence F Bigelow, Wilbur C Jose-Yacaman, Miguel Nackashi, David P Damiano, John Mick, Stephen E Producer: 20090325 In: Microscopy research and technique vol. 72 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	An improved holey carbon film for cryo-electron microscopy. [electronic resource] by Quispe, Joel Damiano, John Mick, Stephen E Nackashi, David P Fellmann, Denis Ajero, Teddy G Carragher, Bridget Potter, Clinton S Producer: 20071206 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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