APA

Schäfer N., Wilkinson A. J., Schmid T., Winkelmann A., Chahine G. A., Schülli T. U., Rissom T., Marquardt J., Schorr S. & Abou-Ras D. (20180126). Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. : Ultramicroscopy.

Chicago

Schäfer Norbert, Wilkinson Angus J, Schmid Thomas, Winkelmann Aimo, Chahine Gilbert A, Schülli Tobias U, Rissom Thorsten, Marquardt Julien, Schorr Susan and Abou-Ras Daniel. 20180126. Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. : Ultramicroscopy.

Harvard

Schäfer N., Wilkinson A. J., Schmid T., Winkelmann A., Chahine G. A., Schülli T. U., Rissom T., Marquardt J., Schorr S. and Abou-Ras D. (20180126). Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. : Ultramicroscopy.

MLA

Schäfer Norbert, Wilkinson Angus J, Schmid Thomas, Winkelmann Aimo, Chahine Gilbert A, Schülli Tobias U, Rissom Thorsten, Marquardt Julien, Schorr Susan and Abou-Ras Daniel. Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. : Ultramicroscopy. 20180126.