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Results of search for 'au:"Marciniak, Michael A"'
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Authors
Benson, Michael R
Burke, John H
Butler, Samuel D
Cole, Walter P
Lott, Gordon E
Marciniak, Michael A
Nauyoks, Stephen E
Vap, Jason C
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1.
Effects of a measurement floor on Mueller matrix measurements in a dual rotating retarder polarimeter bidirectional scatter distribution function system.
[electronic resource]
by
Nauyoks, Stephen E
Marciniak, Michael A
Producer:
20150925
In:
Applied optics
vol. 54
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2.
Path-averaged Cn2 estimation using a laser-and-corner-cube system.
[electronic resource]
by
Cole, Walter P
Marciniak, Michael A
Producer:
20091008
In:
Applied optics
vol. 48
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Available from publisher's website
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3.
Design considerations regarding ellipsoidal mirror based reflectometers.
[electronic resource]
by
Benson, Michael R
Marciniak, Michael A
Producer:
20150416
In:
Optics express
vol. 21
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4.
Comparison of microfacet BRDF model to modified Beckmann-Kirchhoff BRDF model for rough and smooth surfaces.
[electronic resource]
by
Butler, Samuel D
Nauyoks, Stephen E
Marciniak, Michael A
Producer:
20160218
In:
Optics express
vol. 23
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5.
Three-dimensional imaging of trapped cold atoms with a light field microscope.
[electronic resource]
by
Lott, Gordon E
Marciniak, Michael A
Burke, John H
Producer:
20180205
In:
Applied optics
vol. 56
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6.
Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials.
[electronic resource]
by
Vap, Jason C
Nauyoks, Stephen E
Benson, Michael R
Marciniak, Michael A
Producer:
20180205
In:
The Review of scientific instruments
vol. 88
Online resources:
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