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Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope. [electronic resource] by
- Scholl, A
- Marcus, M A
- Doran, A
- Nasiatka, J R
- Young, A T
- MacDowell, A A
- Streubel, R
- Kent, N
- Feng, J
- Wan, W
- Padmore, H A
Producer: 20180813
In:
Ultramicroscopy vol. 188
Availability: No items available.
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18.
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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. [electronic resource] by
- Tamura, N
- MacDowell, A A
- Spolenak, R
- Valek, B C
- Bravman, J C
- Brown, W L
- Celestre, R S
- Padmore, H A
- Batterman, B W
- Patel, J R
Producer: 20030424
In:
Journal of synchrotron radiation vol. 10
Availability: No items available.
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Local plasticity of Al thin films as revealed by x-ray microdiffraction. [electronic resource] by
- Spolenak, R
- Brown, W L
- Tamura, N
- MacDowell, A A
- Celestre, R S
- Padmore, H A
- Valek, B
- Bravman, J C
- Marieb, T
- Fujimoto, H
- Batterman, B W
- Patel, J R
Producer: 20030429
In:
Physical review letters vol. 90
Availability: No items available.
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