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	1.	Toward reproducible three-dimensional microstructure analysis of granular materials and complex suspensions. [electronic resource] by Holzer, Lorenz Münch, Beat Producer: 20090604 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Stripe and ring artifact removal with combined wavelet--Fourier filtering. [electronic resource] by Münch, Beat Trtik, Pavel Marone, Federica Stampanoni, Marco Producer: 20090828 In: Optics express vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Quantification of a single aggregate inner porosity and pore accessibility using hard X-ray phase-contrast nanotomography. [electronic resource] by Trtik, Pavel Soos, Miroslav Münch, Beat Lamprou, Alexandros Mokso, Rajmund Stampanoni, Marco Producer: 20120216 In: Langmuir : the ACS journal of surfaces and colloids vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	3D Microstructure Effects in Ni-YSZ Anodes: Influence of TPB Lengths on the Electrochemical Performance. [electronic resource] by Pecho, Omar M Mai, Andreas Münch, Beat Hocker, Thomas Flatt, Robert J Holzer, Lorenz Publication details: Materials (Basel, Switzerland) Oct 2015 In: Materials (Basel, Switzerland) vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)