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Materials characterisation by angle-resolved scanning transmission electron microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Oppermann, Oliver
- Grieb, Tim
- Krause, Florian F
- Rosenauer, Andreas
- Schowalter, Marco
- Mehrtens, Thorsten
- Beyer, Andreas
- Volz, Kerstin
- Potapov, Pavel
Producer: 20180503
In:
Scientific reports vol. 6
Availability: No items available.
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12.
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Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Grieb, Tim
- Müßener, Jan
- Gauquelin, Nicolas
- Hille, Pascal
- Schörmann, Jörg
- Verbeeck, Johan
- Van Aert, Sandra
- Eickhoff, Martin
- Rosenauer, Andreas
Producer: 20190404
In:
Physical review letters vol. 122
Availability: No items available.
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13.
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Strain analysis from nano-beam electron diffraction: Influence of specimen tilt and beam convergence. [electronic resource] by
- Grieb, Tim
- Krause, Florian F
- Schowalter, Marco
- Zillmann, Dennis
- Sellin, Roman
- Müller-Caspary, Knut
- Mahr, Christoph
- Mehrtens, Thorsten
- Bimberg, Dieter
- Rosenauer, Andreas
Producer: 20180821
In:
Ultramicroscopy vol. 190
Availability: No items available.
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14.
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Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. [electronic resource] by
- Mahr, Christoph
- Müller-Caspary, Knut
- Ritz, Robert
- Simson, Martin
- Grieb, Tim
- Schowalter, Marco
- Krause, Florian F
- Lackmann, Anastasia
- Soltau, Heike
- Wittstock, Arne
- Rosenauer, Andreas
Producer: 20190215
In:
Ultramicroscopy vol. 196
Availability: No items available.
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15.
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Nanoscopic Insights into InGaN/GaN Core-Shell Nanorods: Structure, Composition, and Luminescence. [electronic resource] by
- Müller, Marcus
- Veit, Peter
- Krause, Florian F
- Schimpke, Tilman
- Metzner, Sebastian
- Bertram, Frank
- Mehrtens, Thorsten
- Müller-Caspary, Knut
- Avramescu, Adrian
- Strassburg, Martin
- Rosenauer, Andreas
- Christen, Jürgen
Producer: 20180904
In:
Nano letters vol. 16
Availability: No items available.
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16.
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Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy. [electronic resource] by
- Müller-Caspary, Knut
- Krause, Florian F
- Grieb, Tim
- Löffler, Stefan
- Schowalter, Marco
- Béché, Armand
- Galioit, Vincent
- Marquardt, Dennis
- Zweck, Josef
- Schattschneider, Peter
- Verbeeck, Johan
- Rosenauer, Andreas
Producer: 20180723
In:
Ultramicroscopy vol. 178
Availability: No items available.
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17.
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Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. [electronic resource] by
- Carvalho, Daniel
- Müller-Caspary, Knut
- Schowalter, Marco
- Grieb, Tim
- Mehrtens, Thorsten
- Rosenauer, Andreas
- Ben, Teresa
- García, Rafael
- Redondo-Cubero, Andrés
- Lorenz, Katharina
- Daudin, Bruno
- Morales, Francisco M
Producer: 20180423
In:
Scientific reports vol. 6
Availability: No items available.
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18.
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Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. [electronic resource] by
- Krause, Florian F
- Ahl, Jan-Philipp
- Tytko, Darius
- Choi, Pyuck-Pa
- Egoavil, Ricardo
- Schowalter, Marco
- Mehrtens, Thorsten
- Müller-Caspary, Knut
- Verbeeck, Johan
- Raabe, Dierk
- Hertkorn, Joachim
- Engl, Karl
- Rosenauer, Andreas
Producer: 20151216
In:
Ultramicroscopy vol. 156
Availability: No items available.
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19.
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Metal-insulator-transition engineering by modulation tilt-control in perovskite nickelates for room temperature optical switching. [electronic resource] by
- Liao, Zhaoliang
- Gauquelin, Nicolas
- Green, Robert J
- Müller-Caspary, Knut
- Lobato, Ivan
- Li, Lin
- Van Aert, Sandra
- Verbeeck, Johan
- Huijben, Mark
- Grisolia, Mathieu N
- Rouco, Victor
- El Hage, Ralph
- Villegas, Javier E
- Mercy, Alain
- Bibes, Manuel
- Ghosez, Philippe
- Sawatzky, George A
- Rijnders, Guus
- Koster, Gertjan
Producer: 20180926
In:
Proceedings of the National Academy of Sciences of the United States of America vol. 115
Availability: No items available.
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