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	1.	Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement. [electronic resource] by Lunácek, Jiri Hlubina, Petr Lunácková, Milena Producer: 20090415 In: Applied optics vol. 48 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Spectral interferometry and reflectometry used for characterization of a multilayer mirror. [electronic resource] by Hlubina, Petr Lunácek, Jirí Ciprian, Dalibor Producer: 20090904 In: Optics letters vol. 34 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Spectral interferometric technique to measure the ellipsometric phase of a thin-film structure. [electronic resource] by Hlubina, Petr Ciprian, Dalibor Lunacek, Jiri Producer: 20100201 In: Optics letters vol. 34 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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