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	1.	RTN and Annealing Related to Stress and Temperature in FIND RRAM Array. [electronic resource] by Chen, Chih Yuan Lin, Chrong Jung King, Ya-Chin Publication details: Nanoscale research letters Jan 2019 In: Nanoscale research letters vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Modeling of electron conduction in contact resistive random access memory devices as random telegraph noise. [electronic resource] by Tseng, Yuan Heng Shen, Wen Chao Lin, Chrong Jung Publication details: Journal of applied physics Apr 2012 In: Journal of applied physics vol. 111 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes. [electronic resource] by Su, Chi Tsai, Yi-Pei Lin, Chrong-Jung King, Ya-Chin Publication details: Nanoscale research letters May 2020 In: Nanoscale research letters vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes. [electronic resource] by Tsai, Yi-Pei Hsieh, Ting-Huan Lin, Chrong Jung King, Ya-Chin Publication details: Nanoscale research letters Sep 2017 In: Nanoscale research letters vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes. [electronic resource] by Tsai, Yi-Pei Hsieh, Ting-Huan Lin, Chrong Jung King, Ya-Chin Publication details: Nanoscale research letters 11 2017 In: Nanoscale research letters vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model. [electronic resource] by Kao, Yun-Feng Zhuang, Wei Cheng Lin, Chrong-Jung King, Ya-Chin Publication details: Nanoscale research letters Jul 2018 In: Nanoscale research letters vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process. [electronic resource] by Hsu, Meng-Yin Liao, Chu-Feng Shih, Yi-Hong Lin, Chrong Jung King, Ya-Chin Publication details: Nanoscale research letters Dec 2017 In: Nanoscale research letters vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology. [electronic resource] by Wang, Chien-Ping Shen, Ying-Chun Liou, Peng-Chun Chueh, Yu-Lun Chih, Yue-Der Chang, Jonathan Lin, Chrong-Jung King, Ya-Chin Publication details: Sensors (Basel, Switzerland) Apr 2019 In: Sensors (Basel, Switzerland) vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Retention Model of TaO/HfO [electronic resource] by Lin, Yu-De Chen, Pang-Shiu Lee, Heng-Yuan Chen, Yu-Sheng Rahaman, Sk Ziaur Tsai, Kan-Hsueh Hsu, Chien-Hua Chen, Wei-Su Wang, Pei-Hua King, Ya-Chin Lin, Chrong Jung Publication details: Nanoscale research letters Dec 2017 In: Nanoscale research letters vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)