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	1.	Simulation of the depolarization effect in porous silicon. [electronic resource] by Jun, Kyung Hoon Lim, Koeng Su Producer: 20030409 In: Applied optics vol. 42 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Simulation of depolarization effect by a rough surface for spectroscopic ellipsometry. [electronic resource] by Jun, Kyung Hoon Kwak, Joong Hwan Lim, Koeng Su Producer: 20030624 In: Journal of the Optical Society of America. A, Optics, image science, and vision vol. 20 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Lateral redistribution of trapped charges in nitride/oxide/Si (NOS) investigated by electrostatic force microscopy. [electronic resource] by Baik, Seung Jae Lim, Koeng Su Choi, Wonsup Yoo, Hyunjun Lee, Jang-Sik Shin, Hyunjung Producer: 20111021 In: Nanoscale vol. 3 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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