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	1.	An improved adaptive signal averaging technique for noise reduction and tracking enhancements in continuous wave magnetic resonance. [electronic resource] by Manning, Brian R Cochrane, Corey J Lenahan, Patrick M Producer: 20200413 In: The Review of scientific instruments vol. 91 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Erratum: Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide. [electronic resource] by Cochrane, Corey J Blacksberg, Jordana Anders, Mark A Lenahan, Patrick M Publication details: Scientific reports 01 2017 In: Scientific reports vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide. [electronic resource] by Cochrane, Corey J Blacksberg, Jordana Anders, Mark A Lenahan, Patrick M Producer: 20180501 In: Scientific reports vol. 6 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Apparatus for electrically detected electron nuclear double resonance in solid state electronic devices. [electronic resource] by Manning, Brian R Waskiewicz, Ryan J McCrory, Duane J Lenahan, Patrick M Producer: 20200106 In: The Review of scientific instruments vol. 90 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station. [electronic resource] by McCrory, Duane J Anders, Mark A Ryan, Jason T Shrestha, Pragya R Cheung, Kin P Lenahan, Patrick M Campbell, Jason P Producer: 20190211 In: The Review of scientific instruments vol. 90 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station. [electronic resource] by McCrory, Duane J Anders, Mark A Ryan, Jason T Shrestha, Pragya R Cheung, Kin P Lenahan, Patrick M Campbell, Jason P Publication details: IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society 2018 In: IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)