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	1.	Defect Structure Determination of GaN Films in GaN/AlN/Si Heterostructures by HR-TEM, XRD, and Slow Positrons Experiments. [electronic resource] by Ene, Vladimir Lucian Dinescu, Doru Djourelov, Nikolay Zai, Iulia Vasile, Bogdan Stefan Serban, Andreea Bianca Leca, Victor Andronescu, Ecaterina Publication details: Nanomaterials (Basel, Switzerland) Jan 2020 In: Nanomaterials (Basel, Switzerland) vol. 10 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Study of Edge and Screw Dislocation Density in GaN/Al [electronic resource] by Ene, Vladimir Lucian Dinescu, Doru Zai, Iulia Djourelov, Nikolay Vasile, Bogdan Stefan Serban, Andreea Bianca Leca, Victor Andronescu, Ecaterina Publication details: Materials (Basel, Switzerland) Dec 2019 In: Materials (Basel, Switzerland) vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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