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	1.	Quadrature wavelength scanning interferometry. [electronic resource] by Moschetti, Giuseppe Forbes, Alistair Leach, Richard K Jiang, Xiang O'Connor, Daniel Producer: 20180126 In: Applied optics vol. 55 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Phase and fringe order determination in wavelength scanning interferometry. [electronic resource] by Moschetti, Giuseppe Forbes, Alistair Leach, Richard K Jiang, Xiang O'Connor, Daniel Producer: 20180104 In: Optics express vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	New method development in prehistoric stone tool research: evaluating use duration and data analysis protocols. [electronic resource] by Evans, Adrian A Macdonald, Danielle A Giusca, Claudiu L Leach, Richard K Producer: 20151001 In: Micron (Oxford, England : 1993) vol. 65 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Loose powder detection and surface characterization in selective laser sintering via optical coherence tomography. [electronic resource] by Guan, Guangying Hirsch, Matthias Syam, Wahyudin P Leach, Richard K Huang, Zhihong Clare, Adam T Publication details: Proceedings. Mathematical, physical, and engineering sciences Jul 2016 In: Proceedings. Mathematical, physical, and engineering sciences vol. 472 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Model-based defect detection on structured surfaces having optically unresolved features. [electronic resource] by O'Connor, Daniel Henning, Andrew J Sherlock, Ben Leach, Richard K Coupland, Jeremy Giusca, Claudiu L Producer: 20160212 In: Applied optics vol. 54 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Combined Inkjet Printing and Infrared Sintering of Silver Nanoparticles using a Swathe-by-Swathe and Layer-by-Layer Approach for 3-Dimensional Structures. [electronic resource] by Vaithilingam, Jayasheelan Simonelli, Marco Saleh, Ehab Senin, Nicola Wildman, Ricky D Hague, Richard J M Leach, Richard K Tuck, Christopher J Producer: 20180727 In: ACS applied materials & interfaces vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Aperiodic interferometer for six degrees of freedom position measurement. [electronic resource] by Burt, David P Dobson, Phillip S Docherty, Kevin E Jones, Christopher W Leach, Richard K Thoms, Stephen Weaver, Jonathan M R Zhang, Yuan Producer: 20120724 In: Optics letters vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	The European nanometrology landscape. [electronic resource] by Leach, Richard K Boyd, Robert Burke, Theresa Danzebrink, Hans-Ulrich Dirscherl, Kai Dziomba, Thorsten Gee, Mark Koenders, Ludger Morazzani, Valérie Pidduck, Allan Roy, Debdulal Unger, Wolfgang E S Yacoot, Andrew Producer: 20110418 In: Nanotechnology vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)