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	1.	Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. [electronic resource] by Prosa, Ty J Larson, David J Producer: 20180720 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	None [electronic resource] by Larson, David J Scudder, Geoffrey G E Publication details: ZooKeys 2019 In: ZooKeys vol. 889 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Twelve new species and fifty-three new provincial distribution records of Aleocharinae rove beetles of Saskatchewan, Canada (Coleoptera, Staphylinidae). [electronic resource] by Klimaszewski, Jan Larson, David J Labrecque, Myriam Bourdon, Caroline Producer: 20160902 In: ZooKeys no. 610 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography. [electronic resource] by Rice, Katherine P Chen, Yimeng Prosa, Ty J Larson, David J Producer: 20180627 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability. [electronic resource] by Prosa, Ty J Strennen, Savanna Olson, David Lawrence, Dan Larson, David J Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 04 2019 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstruction. [electronic resource] by Larson, David J Geiser, Brian P Prosa, Ty J Kelly, Thomas F Producer: 20130322 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 18 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Imaging of arsenic Cottrell atmospheres around silicon defects by three-dimensional atom probe tomography. [electronic resource] by Thompson, Keith Flaitz, Philip L Ronsheim, Paul Larson, David J Kelly, Thomas F Producer: 20070921 In: Science (New York, N.Y.) vol. 317 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Review of atom probe FIB-based specimen preparation methods. [electronic resource] by Miller, Michael K Russell, Kaye F Thompson, Keith Alvis, Roger Larson, David J Producer: 20080122 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Spatial distribution maps for atom probe tomography. [electronic resource] by Geiser, Brian P Kelly, Thomas F Larson, David J Schneir, Jason Roberts, Jay P Producer: 20080122 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 13 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Electrostatic simulations of a local electrode atom probe: the dependence of tomographic reconstruction parameters on specimen and microscope geometry. [electronic resource] by Loi, Shyeh Tjing Gault, Baptiste Ringer, Simon P Larson, David J Geiser, Brian P Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	A case report of sporadic ovine listerial menigoencephalitis in Iowa with an overview of livestock and human cases. [electronic resource] by Wesley, Irene V Larson, David J Harmon, Karen M Luchansky, John B Schwartz, Ann Ramos Producer: 20030129 In: Journal of veterinary diagnostic investigation : official publication of the American Association of Veterinary Laboratory Diagnosticians, Inc vol. 14 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography data. [electronic resource] by Keenan, Michael R Smentkowski, Vincent S Ulfig, Robert M Oltman, Edward Larson, David J Kelly, Thomas F Producer: 20110909 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Dopant Distribution in Atomic Layer Deposited ZnO:Al Films Visualized by Transmission Electron Microscopy and Atom Probe Tomography. [electronic resource] by Wu, Yizhi Giddings, A Devin Verheijen, Marcel A Macco, Bart Prosa, Ty J Larson, David J Roozeboom, Fred Kessels, Wilhelmus M M Publication details: Chemistry of materials : a publication of the American Chemical Society Feb 2018 In: Chemistry of materials : a publication of the American Chemical Society vol. 30 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)