APA
Mirchin N., Apter B., Lapsker I., Fogel V., Gorodetsky U., Popescu S. A., Peled A., Popescu-Pelin G., Dorcioman G., Duta L., Popescu A. & Mihailescu I. N. (20120726). Measuring nanolayer profiles of various materials by evanescent light technique. : Journal of nanoscience and nanotechnology.
Chicago
Mirchin Nina, Apter Boris, Lapsker Igor, Fogel V, Gorodetsky Uri, Popescu Simona A, Peled Aaron, Popescu-Pelin Gianina, Dorcioman Gabriela, Duta Liviu, Popescu Andrei and Mihailescu Ion N. 20120726. Measuring nanolayer profiles of various materials by evanescent light technique. : Journal of nanoscience and nanotechnology.
Harvard
Mirchin N., Apter B., Lapsker I., Fogel V., Gorodetsky U., Popescu S. A., Peled A., Popescu-Pelin G., Dorcioman G., Duta L., Popescu A. and Mihailescu I. N. (20120726). Measuring nanolayer profiles of various materials by evanescent light technique. : Journal of nanoscience and nanotechnology.
MLA
Mirchin Nina, Apter Boris, Lapsker Igor, Fogel V, Gorodetsky Uri, Popescu Simona A, Peled Aaron, Popescu-Pelin Gianina, Dorcioman Gabriela, Duta Liviu, Popescu Andrei and Mihailescu Ion N. Measuring nanolayer profiles of various materials by evanescent light technique. : Journal of nanoscience and nanotechnology. 20120726.