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	1.	On-Chip Gate Electrostatic Discharge Protection Design for 900 V Power Metal Oxide Semiconductor Field Effect Transistor Using Punch-Through Diode Without Degrading Switching Loss. [electronic resource] by Kim, Seongbin Kyoung, Sinsu Publication details: Journal of nanoscience and nanotechnology Oct 2019 In: Journal of nanoscience and nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Investigation of Thickness Dependence of Metal Layer in Al/Mo/4H-SiC Schottky Barrier Diodes. [electronic resource] by Lee, Seula Lee, Jinseon Kang, Tai-Young Kyoung, Sinsu Jung, Eun Sik Kim, Kyung Hwan Producer: 20160202 In: Journal of nanoscience and nanotechnology vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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