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	1.	Origins of growth stresses in amorphous semiconductor thin films. [electronic resource] by Floro, J A Kotula, P G Seel, S C Srolovitz, D J Producer: 20031028 In: Physical review letters vol. 91 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Synthesis of Au-MoS(2) nanocomposites: thermal and friction-induced changes to the structure. [electronic resource] by Scharf, T W Goeke, R S Kotula, P G Prasad, S V Producer: 20140707 In: ACS applied materials & interfaces vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Self-assembled columns of stacked lipid bilayers mediated by metal ion recognition. [electronic resource] by Waggoner, T A Last, J A Kotula, P G Sasaki, D Y Producer: 20010920 In: Journal of the American Chemical Society vol. 123 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Multivariate statistical analysis of concatenated time-of-flight secondary ion mass spectrometry spectral images. Complete description of the sample with one analysis. [electronic resource] by Smentkowski, V S Keenan, M R Ohlhausen, J A Tony Kotula, P G Producer: 20070117 In: Analytical chemistry vol. 77 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection. [electronic resource] by Patterson, N Adams, D P Hodges, V C Vasile, M J Michael, J R Kotula, P G Producer: 20121002 In: Nanotechnology vol. 19 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets. [electronic resource] by Smentkowski, V S Ostrowski, S G Braunstein, E Keenan, M R Ohlhausen, J A Kotula, P G Producer: 20071212 In: Analytical chemistry vol. 79 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Using the FIB to characterize nanoparticle materials. [electronic resource] by Perrey, C R Carter, C B Michael, J R Kotula, P G Stach, E A Radmilovic, V R Producer: 20040701 In: Journal of microscopy vol. 214 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Growth and sintering of fullerene nanotubes. [electronic resource] by Colbert, D T Zhang, J McClure, S M Nikolaev, P Chen, Z Hafner, J H Owens, D W Kotula, P G Carter, C B Weaver, J H Rinzler, A G Smalley, R E Producer: 20100702 In: Science (New York, N.Y.) vol. 266 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)