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	1.	Quality Assessment of Sharpened Images: Challenges, Methodology, and Objective Metrics. [electronic resource] by Krasula, Lukas Le Callet, Patrick Fliegel, Karel Klima, Milos Publication details: IEEE transactions on image processing : a publication of the IEEE Signal Processing Society 03 2017 In: IEEE transactions on image processing : a publication of the IEEE Signal Processing Society vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	OFT sectorization approach to analysis of optical scattering in mercurous chloride single crystals. [electronic resource] by Pata, Petr Klima, Milos Bednar, Jan Janout, Petr Barta, Cestmir Hasal, Radek Maresi, Luca Grabarnik, Semen Producer: 20151202 In: Optics express vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Three-dimensional super-resolution structured illumination microscopy with maximum a posteriori probability image estimation. [electronic resource] by Lukeš, Tomáš Křížek, Pavel Švindrych, Zdeněk Benda, Jakub Ovesný, Martin Fliegel, Karel Klíma, Miloš Hagen, Guy M Producer: 20151110 In: Optics express vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Direct mid-infrared femtosecond pulse shaping with a calomel acousto-optic programmable dispersive filter. [electronic resource] by Maksimenka, Raman Nuernberger, Patrick Lee, Kevin F Bonvalet, Adeline Milkiewicz, Jadwiga Barta, Cestmir Klima, Miloš Oksenhendler, Thomas Tournois, Pierre Kaplan, Daniel Joffre, Manuel Producer: 20110215 In: Optics letters vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)