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	1.	Electrical Properties and Reliability Analysis of Solution-Processed Indium Tin Zinc Oxide Thin Film Transistors with O2-Plasma Treatment. [electronic resource] by Ko, Sun Wook Kim, Soon Kon Kim, Jong Min Cho, Jae Hee Park, Hyoung Sun Choi, Byoung Deog Producer: 20160208 In: Journal of nanoscience and nanotechnology vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Electrical Properties of Solution Processed In-Ga-ZnO Thin Film Transistors with Multi-Stacked Active Layer. [electronic resource] by Kim, Soon Kon Choi, Pyung Ho Kim, Sang Sub Kim, Hyun Woo Lee, Na Young Choi, Byoung Deog Producer: 20160208 In: Journal of nanoscience and nanotechnology vol. 15 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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