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	1.	Real-time monitoring and growth control of Si-gradient-index structures by multiwavelength ellipsometry. [electronic resource] by Kildemo, M Producer: 20091216 In: Applied optics vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Spectroellipsometric method for process monitoring semiconductor thin films and interfaces. [electronic resource] by Kildemo, M Brenot, R Drévillon, B Producer: 20121002 In: Applied optics vol. 37 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Anisotropic incoherent reflection model for spectroscopic ellipsometry of a thick semitransparent anisotropic substrate. [electronic resource] by Ossikovski, R Kildemo, M Stchakovsky, M Mooney, M Producer: 20121002 In: Applied optics vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Real-time control by multiwavelength ellipsometry of plasma-deposited multilayers on glass by use of an incoherent-reflection model. [electronic resource] by Kildemo, M Bulkin, P Drévillon, B Hunderi, O Producer: 20121002 In: Applied optics vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	Investigation of a half-wave method for birefringence or thickness measurements of a thick, semitransparent, uniaxial, anisotropic substrate by use of spectroscopic ellipsometry. [electronic resource] by Kildemo, M Mooney, M Sudre, C Kelly, P V Producer: 20091215 In: Applied optics vol. 39 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Critical dimension metrology of a plasmonic photonic crystal based on Mueller matrix ellipsometry and the reduced Rayleigh equation. [electronic resource] by Banon, J-P Nesse, T Ghadyani, Z Kildemo, M Simonsen, I Producer: 20180205 In: Optics letters vol. 42 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Anisotropic plasmonic Cu nanoparticles in sol-gel oxide nanopillars studied by spectroscopic Mueller matrix ellipsometry. [electronic resource] by Ghadyani, Z Kildemo, M Aas, L M S Cohin, Y Søndergård, E Producer: 20141028 In: Optics express vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Characterization of nanostructured GaSb: comparison between large-area optical and local direct microscopic techniques. [electronic resource] by Nerbø, I S Kildemo, M Le Roy, S Simonsen, I Søndergård, E Holt, L Walmsley, J C Producer: 20081015 In: Applied optics vol. 47 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)