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	1.	Subnanosecond Thomson scattering on a vacuum arc discharge in tin vapor. [electronic resource] by Kieft, E R van der Mullen, J J A M Banine, V Producer: 20060104 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 72 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges. [electronic resource] by Kieft, E R Garloff, K van der Mullen, J J A M Banine, V Producer: 20050822 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 71 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Time-resolved pinhole camera imaging and extreme ultraviolet spectrometry on a hollow cathode discharge in xenon. [electronic resource] by Kieft, E R van der Mullen, J J A M Kroesen, G M W Banine, V Producer: 20040212 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 68 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker. [electronic resource] by Weppelman, I G C Moerland, R J Zhang, L Kieft, E Kruit, P Hoogenboom, J P Publication details: Structural dynamics (Melville, N.Y.) Mar 2019 In: Structural dynamics (Melville, N.Y.) vol. 6 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	High quality ultrafast transmission electron microscopy using resonant microwave cavities. [electronic resource] by Verhoeven, W van Rens, J F M Kieft, E R Mutsaers, P H A Luiten, O J Producer: 20180813 In: Ultramicroscopy vol. 188 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Collective Thomson scattering experiments on a tin vapor discharge in the prepinch phase. [electronic resource] by Kieft, E R van der Mullen, J J A M Kroesen, G M W Banine, V Koshelev, K N Producer: 20050215 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 70 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Characterization of a vacuum-arc discharge in tin vapor using time-resolved plasma imaging and extreme ultraviolet spectrometry. [electronic resource] by Kieft, E R van der Mullen, J J A M Kroesen, G M W Banine, V Koshelev, K N Producer: 20050531 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 71 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Stark broadening experiments on a vacuum arc discharge in tin vapor. [electronic resource] by Kieft, E R van der Mullen, J J A M Kroesen, G M W Banine, V Koshelev, K N Producer: 20050930 In: Physical review. E, Statistical, nonlinear, and soft matter physics vol. 70 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities. [electronic resource] by Verhoeven, W van Rens, J F M Toonen, W F Kieft, E R Mutsaers, P H A Luiten, O J Publication details: Structural dynamics (Melville, N.Y.) Sep 2018 In: Structural dynamics (Melville, N.Y.) vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Complementary cathodoluminescence lifetime imaging configurations in a scanning electron microscope. [electronic resource] by Meuret, S Solà Garcia, M Coenen, T Kieft, E Zeijlemaker, H Lätzel, M Christiansen, S Woo, S Y Ra, Y H Mi, Z Polman, A Producer: 20190313 In: Ultramicroscopy vol. 197 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Time-of-flight electron energy loss spectroscopy using TM [electronic resource] by Verhoeven, W van Rens, J F M van Ninhuijs, M A W Toonen, W F Kieft, E R Mutsaers, P H A Luiten, O J Publication details: Structural dynamics (Melville, N.Y.) Sep 2016 In: Structural dynamics (Melville, N.Y.) vol. 3 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM [electronic resource] by van Rens, J F M Verhoeven, W Franssen, J G H Lassise, A C Stragier, X F D Kieft, E R Mutsaers, P H A Luiten, O J Producer: 20180807 In: Ultramicroscopy vol. 184 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Design and characterization of dielectric filled TM [electronic resource] by Verhoeven, W van Rens, J F M Kemper, A H Rietman, E H van Doorn, H A Koole, I Kieft, E R Mutsaers, P H A Luiten, O J Publication details: The Review of scientific instruments Aug 2019 In: The Review of scientific instruments vol. 90 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)