Your search returned 5 results.

Results
	1.	Performance of Orbitrap mass analyzer at various space charge and non-ideal field conditions: simulation approach. [electronic resource] by Kharchenko, Andriy Vladimirov, Gleb Heeren, Ron M A Nikolaev, Eugene N Producer: 20120625 In: Journal of the American Society for Mass Spectrometry vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Comparison of particle-in-cell simulations with experimentally observed frequency shifts between ions of the same mass-to-charge in Fourier transform ion cyclotron resonance mass spectrometry. [electronic resource] by Leach, Franklin E Kharchenko, Andriy Heeren, Ron M A Nikolaev, Eugene Amster, I Jonathan Producer: 20100422 In: Journal of the American Society for Mass Spectrometry vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Advanced mass calibration and visualization for FT-ICR mass spectrometry imaging. [electronic resource] by Smith, Donald F Kharchenko, Andriy Konijnenburg, Marco Klinkert, Ivo Paša-Tolić, Ljiljana Heeren, Ron M A Producer: 20130107 In: Journal of the American Society for Mass Spectrometry vol. 23 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	Multiparticle Simulations of Quadrupolar Ion Detection in an Ion Cyclotron Resonance Cell with Four Narrow Aperture Detection Electrodes. [electronic resource] by Driver, Joshua A Nagornov, Konstantin O Kozhinov, Anton N Tsybin, Yury O Kharchenko, Andriy Amster, I Jonathan Publication details: Journal of the American Society for Mass Spectrometry 01 2018 In: Journal of the American Society for Mass Spectrometry vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	C60+ secondary ion microscopy using a delay line detector. [electronic resource] by Klerk, Leendert A Lockyer, Nicholas P Kharchenko, Andriy MacAleese, Luke Dankers, Patricia Y W Vickerman, John C Heeren, Ron M A Producer: 20100518 In: Analytical chemistry vol. 82 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)