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	1.	Impact of Line Edge Roughness on ReRAM Uniformity and Scaling. [electronic resource] by Constantoudis, Vassilios Papavieros, George Karakolis, Panagiotis Khiat, Ali Prodromakis, Themistoklis Dimitrakis, Panagiotis Publication details: Materials (Basel, Switzerland) Nov 2019 In: Materials (Basel, Switzerland) vol. 12 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Graphene-Modified Interface Controls Transition from VCM to ECM Switching Modes in Ta/TaOx Based Memristive Devices. [electronic resource] by Lübben, Michael Karakolis, Panagiotis Ioannou-Sougleridis, Vassilios Normand, Pascal Dimitrakis, Panagiotis Valov, Ilia Producer: 20160122 In: Advanced materials (Deerfield Beach, Fla.) vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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