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	1.	3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography. [electronic resource] by Kambham, Ajay Kumar Kumar, Arul Gilbert, Matthieu Vandervorst, Wilfried Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography. [electronic resource] by Kambham, Ajay Kumar Kumar, Arul Florakis, Antonios Vandervorst, Wilfried Producer: 20140117 In: Nanotechnology vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Atomic insight into Ge₁₋xSnx using atom probe tomography. [electronic resource] by Kumar, Arul Komalan, Manu P Lenka, Haraprasanna Kambham, Ajay Kumar Gilbert, Matthieu Gencarelli, Federica Vincent, Benjamin Vandervorst, Wilfried Producer: 20140424 In: Ultramicroscopy vol. 132 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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