APA

Dev S., Wang Y., Kim K., Zamiri M., Kadlec C., Goldflam M., Hawkins S., Shaner E., Kim J., Krishna S., Allen M., Allen J., Tutuc E. & Wasserman D. (042019). Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits. : Nature communications.

Chicago

Dev Sukrith, Wang Yinan, Kim Kyounghwan, Zamiri Marziyeh, Kadlec Clark, Goldflam Michael, Hawkins Samuel, Shaner Eric, Kim Jin, Krishna Sanjay, Allen Monica, Allen Jeffery, Tutuc Emanuel and Wasserman Daniel. 042019. Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits. : Nature communications.

Harvard

Dev S., Wang Y., Kim K., Zamiri M., Kadlec C., Goldflam M., Hawkins S., Shaner E., Kim J., Krishna S., Allen M., Allen J., Tutuc E. and Wasserman D. (042019). Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits. : Nature communications.

MLA

Dev Sukrith, Wang Yinan, Kim Kyounghwan, Zamiri Marziyeh, Kadlec Clark, Goldflam Michael, Hawkins Samuel, Shaner Eric, Kim Jin, Krishna Sanjay, Allen Monica, Allen Jeffery, Tutuc Emanuel and Wasserman Daniel. Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits. : Nature communications. 042019.