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	1.	Fundamental Constants for Quantitative X-ray Microanalysis. [electronic resource] by Joy, David C Publication details: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Mar 2001 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 7 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	Scanning electron microscopy: Second best no more. [electronic resource] by Joy, David C Producer: 20091023 In: Nature materials vol. 8 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Quantitative measurements of charging in a gaseous environment. [electronic resource] by Tang, Xiaohu Joy, David C Producer: 20031009 In: Scanning vol. 25 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	A novel technique for visualizing electron beam induced charging. [electronic resource] by Tang, Xiaohu Joy, David C Producer: 20041202 In: Scanning vol. 26 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	5.	An experimental model of beam broadening in the variable pressure scanning electron microscope. [electronic resource] by Tang, Xiaohu Joy, David C Producer: 20060216 In: Scanning vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	6.	Is microanalysis possible in the helium ion microscope? [electronic resource] by Joy, David C Griffin, Brendan J Producer: 20111107 In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 17 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	7.	Holographic voltage profiling on 75 nm gate architecture CMOS devices. [electronic resource] by Thesen, Alexander E Frost, Bernhard G Joy, David C Producer: 20030411 In: Ultramicroscopy vol. 94 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	8.	Monte Carlo simulation of focused helium ion beam induced deposition. [electronic resource] by Smith, Daryl A Joy, David C Rack, Philip D Producer: 20100720 In: Nanotechnology vol. 21 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	9.	Do SE(II) electrons really degrade SEM image quality? [electronic resource] by Bernstein, Gary H Carter, Andrew D Joy, David C Producer: 20130729 In: Scanning vol. 35 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	10.	Electron beam induced radiation damage in the catalyst layer of a proton exchange membrane fuel cell. [electronic resource] by He, Qianping Chen, Jihua Keffer, David J Joy, David C Producer: 20150414 In: Scanning vol. 36 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	11.	Effect of electron beam-induced deposition and etching under bias. [electronic resource] by Choi, Young R Rack, Philip D Frost, Bernhard Joy, David C Producer: 20070913 In: Scanning vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	12.	A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope. [electronic resource] by Gauvin, Raynald Griffin, Brendan Nockolds, Clive Phillips, Mathew Joy, David C Producer: 20020829 In: Scanning vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	13.	Nanotip electron gun for the scanning electron microscope. [electronic resource] by Vladár, András E Radi, Zsolt Postek, Michael T Joy, David C Producer: 20060831 In: Scanning vol. 28 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	14.	Nanoscale imaging of whole cells using a liquid enclosure and a scanning transmission electron microscope. [electronic resource] by Peckys, Diana B Veith, Gabriel M Joy, David C de Jonge, Niels Producer: 20100317 In: PloS one vol. 4 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	15.	On the production of X-rays by low energy ion beams. [electronic resource] by Joy, David C Meyer, Harry M Bolorizadeh, Mehdi Lin, Yinghong Newbury, Dale Producer: 20070329 In: Scanning vol. 29 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	16.	Pressure effect of growing with electron beam-induced deposition with tungsten hexafluoride and tetraethylorthosilicate precursor. [electronic resource] by Choi, Young R Rack, Philip D Randolph, Steven J Smith, Daryl A Joy, David C Producer: 20070104 In: Scanning vol. 28 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	17.	Adhesion of spores of Bacillus thuringiensis on a planar surface. [electronic resource] by Chung, Eunhyea Kweon, Hyojin Yiacoumi, Sotira Lee, Ida Joy, David C Palumbo, Anthony V Tsouris, Costas Producer: 20100325 In: Environmental science & technology vol. 44 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	18.	Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy. [electronic resource] by Iberi, Vighter Vlassiouk, Ivan Zhang, X-G Matola, Brad Linn, Allison Joy, David C Rondinone, Adam J Producer: 20151217 In: Scientific reports vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	19.	Graphene engineering by neon ion beams. [electronic resource] by Iberi, Vighter Ievlev, Anton V Vlassiouk, Ivan Jesse, Stephen Kalinin, Sergei V Joy, David C Rondinone, Adam J Belianinov, Alex Ovchinnikova, Olga S Producer: 20160621 In: Nanotechnology vol. 27 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	20.	Building with ions: towards direct write of platinum nanostructures using in situ liquid cell helium ion microscopy. [electronic resource] by Ievlev, Anton V Jakowski, Jacek Burch, Matthew J Iberi, Vighter Hysmith, Holland Joy, David C Sumpter, Bobby G Belianinov, Alex Unocic, Raymond R Ovchinnikova, Olga S Producer: 20180719 In: Nanoscale vol. 9 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)

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Your search returned 24 results.