Your search returned 4 results.

Results
	1.	Determination of the absolute thickness of ultrathin Al2O3 overlayers on Si (100) substrate. [electronic resource] by Kim, Kyung Joong Jang, Jong Shik Lee, Joo-Hee Jee, Yun-Jung Jun, Chung-Sam Producer: 20100118 In: Analytical chemistry vol. 81 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	2.	In situ determination of the pore opening point during wet-chemical etching of the barrier layer of porous anodic aluminum oxide: nonuniform impurity distribution in anodic oxide. [electronic resource] by Han, Hee Park, Sang-Joon Jang, Jong Shik Ryu, Hyun Kim, Kyung Joong Baik, Sunggi Lee, Woo Producer: 20131025 In: ACS applied materials & interfaces vol. 5 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	3.	Active doping of B in silicon nanostructures and development of a Si quantum dot solar cell. [electronic resource] by Hong, Seung Hui Kim, Yong Sung Lee, Woo Kim, Young Heon Song, Jae Yong Jang, Jong Shik Park, Jae Hee Choi, Suk-Ho Kim, Kyung Joong Producer: 20120123 In: Nanotechnology vol. 22 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)
	4.	In situ control of oxygen vacancies in TiO₂ by atomic layer deposition for resistive switching devices. [electronic resource] by Park, Sang-Joon Lee, Jeong-Pyo Jang, Jong Shik Rhu, Hyun Yu, Hyunung You, Byung Youn Kim, Chang Soo Kim, Kyung Joong Cho, Yong Jai Baik, Sunggi Lee, Woo Producer: 20140127 In: Nanotechnology vol. 24 Online resources: Available from publisher's website Availability: No items available. Save to lists Add to cart (remove)